Nickel-Plated Tungsten Carbide Needle for Semiconductor Testing
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...Tungsten Carbide Needle The precision probe with electroplated nickel layer, with ultra-low contact resistance of 0.02Ω and HV500 hardness coating, overcomes the wear and oxidation sore points of ordinary gold-plated needles, and achieves zero-attenuation transmission of microampere-level signals in the fields of semiconductor testing......
Zhuzhou Sanxin Cemented Carbide Manufacturing Co., Ltd
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Gold Plated Spring Test Probe with 2A Current Rating and Custom Sizes for Precision Semiconductor Testing
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High Quality Switch Contact Pin Test Probe YF DE1-051BB33-01C0 High Efficiency BGA Testing Probes Precision spring-loaded semiconductor test pins designed for reliable performance in demanding testing applications. Key Product Features High Conductivity ......
SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD.
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99.95% Polished Alloy Tungsten Metal Plate For Semiconductor Electronics Tungsten Carbide Plate Tungsten Plate Target
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... with high melting point and low thermal expansion coefficient in high temperature environment. The surface of the polished tungsten plate is steel gray or silver white, with high hardness, high melting point, low thermal expansion coefficient, and is not...
Shaanxi Peakrise Metal Co.,Ltd
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High Efficient Semiconductor Test Pin BGA Testing Probes Spring Loaded
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Semiconductor Test Pin High Efficient Factory Supply Bga Testing Probes Spring Loaded Din connector is a type of RF connectors. BNC's compact design, high durability and outstanding electronic performance have made it one of the most widely used connectors......
Charter Leader Precision Electronic Co.,Ltd
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Ingress Protection Test Equipment IEC 60132 60335 Standard Test Probe Pin Thorn Kit
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...Test Equipment IEC 60132 60335 Standard Test Probe Pin Thorn Kit Product information: The IEC 60132/60335 standard Test Probe Pin Thorn Kit are the necessary items for household and similar electrical appliances anti-electric shock protection test. The test kit consists of : No. Item Name Stadanrd 1 Test Probe B IEC 61032 figure 2 2 Test Probe 13 IEC 61032 figure 9 3 Test Probe 41 IEC 61032 figure 16 1. Stadard Test......
Guangzhou HongCe Equipment Co., Ltd.
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Sapphire Lift Pin For Semiconductor Ceramic Lift Pins High Purity Sapphire Pins
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Sapphire lift pin for semiconductor Ceramic lift pins High purity sapphire pins Abstract of Sapphire lift pin Sapphire lift pins are precision-engineered components widely used in semiconductor processing equipment, particularly in wafer handling, ......
SHANGHAI FAMOUS TRADE CO.,LTD
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Short test pin,test probe pin,safety test probe,quality safety test probe
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... is made of stainless steel with a plastic handle. Meets IEC 60950 and 61032, Figure 9 (Test Probe} Model TP12 Short test pin Used to test accessibility through enclosure openings per IEC, EN, UL and CSA Standards. Body is plastic, tip is stainless steel....
ALLIED TESTING (HK) CO.,LTD.
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Pogo Pin,Spring-loaded Pin,,Test Probe Pin.Gold-Plated Solder Pin or PCB Test Pin Factory from Shenzhen, China
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Pogo Pin,Spring-loaded Pin,,Test Probe Pin.Gold-Plated Solder Pin or PCB Test Pin Factory from Shenzhen, China Company Information Production Workshops & Testing Equipments & Certification Quality Assurance 1> IQC: Incoming material control to make sure......
Shenzhen Hardware Technology Co.,Ltd
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IEC60335 Electrical Safety Testing Probe Pin For Scratch Resistance Test
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...Testing Probe Pin For Scratch Resistance Test IEC60335-1 Clause 21 Scratched Pin For Scratch Resistance Test Of The Electrical Solid Insulation Surface Product information: The test pin is used to do the scratch resistant test of the electrical solid insulation surface. It conforms to the standard requirement of IEC60335-1 clause 21. Test method: make sure the angle between the pin......
Dongguan Kingpo Technology Limited
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IEC 60884-1 Figure 14 Non - Solid Pins Test Device For Mechanical Strength Test Of Pins Of Portable Accessories
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...ch are not solid, by the following test which is made after the test of clause 21. A force of 100 N is exerted on the pin, which is supported as shown in IEC60884-1, figure 14, for 1 min in a direction perpendicular to the axis of the pin, by means of a...
KingPo Technology Development Limited
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