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| Categories | IP Test Equipment |
|---|---|
| Brand Name: | HJ |
| Model Number: | HT-IPX1-4 |
| Certification: | calibration certificate (cost additional) |
| Place of Origin: | China |
| MOQ: | 1 set |
| Supply Ability: | 20 set per month |
| Delivery Time: | 7 days |
| Packaging Details: | Carton Box |
| Price: | Negotiatable |
| Usage: | Tests for protection of persons against access to hazardous parts |
| Application: | Test conditions for degrees of protection indicated by the first characteristic numeral 1,2,3,4 |
| Function: | Tests for protection against solid foreign objects indicated by the first characteristic numeral |
| Material: | Stainless steel and Nylon |
| Payment Terms: | T/T, L/C |
| Company Info. |
| HJ AUTOMATIC CONTROL TECHNOLOGY CO., LTD |
| Verified Supplier |
| View Contact Details |
| Product List |
IP Test Equipment Access Probes For The Tests For Degrees Of Protection By IP1X To IP4X
Standard:
IEC 60529 Degrees of protection provided by enclosures (IP Code) IP1X, IP2X, IP3X, IP4X
Application:
It is used to indicate the degrees of protection provided by an enclosure against access to hazardous parts, ingress of solid foreign objects.
Parameter:
It is concluded to the following test probes according to the degree of protection provided by an enclosure is indicated by the IP Code:


| Model | HT-I01 |
| Name | Test probe A |
| Rigid test ball diameter (metal) | SФ50+0.05 0 |
| Baffle diameter (nylon) | Ф45±0.2 |
| Baffle thickness | 4 |
| Handle diameter | Ф10 |
| Handle length (nylon) | 100 |
| Force | ---- |
| Model | HT-I02 |
| Name | Standard Test Finger |
| Joint 1 | 30±0.2 |
| Joint 2 | 60±0.2 |
| Finger length | 80±0.2 |
| Fingertip to baffle | 180±0.2 |
| Cylindrical | R2±0.05 |
| Spherical | R4±0.05 |
| Fingertip cutting bevel angle | 37o 0 -10′ |
| Fingertip taper | 14 o 0 -10′ |
| Test finger diameter | Ф12 0 -0.05 |
| A-A Section diameter | Ф50 |
| A-A Section width | 20±0.2 |
| Baffle diameter | Ф75±0.2 |
| Baffle thickness | 5±0.5 |
| Force | ---- |
| Model | HT-I03 |
| Name | Test rod probe C |
| Probe diameter | Ф2.5+0.05 0 |
| Sphere diameter | SФ35±0.2 |
| Handle diameter | Ф10 |
| Probe length | 100±0.2 |
| Handle length | 100 |
| Force | ---- |
| Model | HT-I04 |
| Name | Test rod probe D |
| Diameter of the metal wire | Ф1+0.05 0 |
| Sphere diameter | SФ35±0.2 |
| Handle diameter | Ф10 |
| Probe length | 100±0.2 |
| Handle length | 100 |
| Force | ---- |
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